Journal Paper

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Year Paper Title
2002 Lee, J. C., Hung, H. N., Pearn, W. L. and Kueng, T. L., On the Distribution of the Estimated Process Yield Index Spk, Quality and Reliability Engineering International, No. 18. 111-116, 2002
2001 Rubin GS, Bandeen-Roche K, Huang GH, Munoz B, Schein OD, Fried LP, West SK, The association of multiple visual impairments with self-reported visual disability: SEE project, Investigative Ophthalmology & Visual Science, 42, 64-72., Jan. 2001
2001 H. Hung, Y. Lin, N. Peng and S. Tsai, Repacking on Demand in Multitier Wireless Local Loop Network, submitted., 2001
2001 W. Chan and N. Peng, Continuous time Markov chains on alternating renewal process with exponential duration, Statistics and Probability Letters ( in revision )., 2001
2001 H. Hung, Y. Lin, N. Peng and S. Yang, Resolving Mobile Database Overflow With Most Idle Replacement, IEEE Journal On Selected Areas In Communications, Vol. 19, No. 10., 2001
2001 W. Chan and N. Peng, Continuous time Markov chains on cyclic stages, (Peer-Reviewed Proceedings of ) 10th International Symposium on Applied Stochastic Models and Data Analysis (Invited Session), 301-306., 2001
2001 Chen, C.-M., Lu, H. H.-S., and Hsiao, A.-T., A Dual Snake Model of High Penetrability for Ultrasound Image Boundary Extraction, Ultrasound in Medicine and Biology, 27, 12, 1651-1665. (SCI), 2001
2001 Chen, C.-M., Lu, H. H. S., and Hsu, Y.-P., Cross-Reference Maximum Likelihood Estimate Reconstruction for Positron Emission Tomography, Biomedical Engineering-Applications, Basis and Communications, 13, 4, 190-198. (EI), 2001
2001 Tu, K. Y., Chen, T. B., Lu, H. H. S., Liu, R. S., Chen, K. L., Chen, C. M., and Chen, J. C., Empirical Studies of Cross-Reference Maximum Likelihood Estimate Reconstruction for Positron Emission Tomography, Biomedical Engineering-Applications, Basis and Communications, 13, 1, 1-7. (EI), 2001
2001 Huang, H.-C., Chen, C.-M., Wang, S.-D., and Lu, H. H.-S., Adaptive Symmetric Mean Filter: A New Noise Reduction Approach Based on the Slope Facet Model, Applied Optics, 40, 29, 5192-5205. (SCI), 2001