2002 |
Lee, J. C., Hung, H. N., Pearn, W. L. and Kueng, T. L., On the Distribution of the Estimated Process Yield Index Spk, Quality and Reliability Engineering International, No. 18. 111-116, 2002 |
2001 |
Rubin GS, Bandeen-Roche K, Huang GH, Munoz B, Schein OD, Fried LP, West SK, The association of multiple visual impairments with self-reported visual disability: SEE project, Investigative Ophthalmology & Visual Science, 42, 64-72., Jan. 2001 |
2001 |
H. Hung, Y. Lin, N. Peng and S. Tsai, Repacking on Demand in Multitier Wireless Local Loop Network, submitted., 2001 |
2001 |
W. Chan and N. Peng, Continuous time Markov chains on alternating renewal process with exponential duration, Statistics and Probability Letters ( in revision )., 2001 |
2001 |
H. Hung, Y. Lin, N. Peng and S. Yang, Resolving Mobile Database Overflow With Most Idle Replacement, IEEE Journal On Selected Areas In Communications, Vol. 19, No. 10., 2001 |
2001 |
W. Chan and N. Peng, Continuous time Markov chains on cyclic stages, (Peer-Reviewed Proceedings of ) 10th International Symposium on Applied Stochastic Models and Data Analysis (Invited Session), 301-306., 2001 |
2001 |
Chen, C.-M., Lu, H. H.-S., and Hsiao, A.-T., A Dual Snake Model of High Penetrability for Ultrasound Image Boundary Extraction, Ultrasound in Medicine and Biology, 27, 12, 1651-1665. (SCI), 2001 |
2001 |
Chen, C.-M., Lu, H. H. S., and Hsu, Y.-P., Cross-Reference Maximum Likelihood Estimate Reconstruction for Positron Emission Tomography, Biomedical Engineering-Applications, Basis and Communications, 13, 4, 190-198. (EI), 2001 |
2001 |
Tu, K. Y., Chen, T. B., Lu, H. H. S., Liu, R. S., Chen, K. L., Chen, C. M., and Chen, J. C., Empirical Studies of Cross-Reference Maximum Likelihood Estimate Reconstruction for Positron Emission Tomography, Biomedical Engineering-Applications, Basis and Communications, 13, 1, 1-7. (EI), 2001 |
2001 |
Huang, H.-C., Chen, C.-M., Wang, S.-D., and Lu, H. H.-S., Adaptive Symmetric Mean Filter: A New Noise Reduction Approach Based on the Slope Facet Model, Applied Optics, 40, 29, 5192-5205. (SCI), 2001 |