| Year | 2007 |
|---|---|
| Authors | Nanfu Peng /N. Peng |
| Paper Title | Testing process precision for truncated normal distributions |
| Journal Title | Microelectronics Reliability |
Login Institute of Statistics, NYCU
Login Institute of Statistics, NYCU
| Year | 2007 |
|---|---|
| Authors | Nanfu Peng /N. Peng |
| Paper Title | Testing process precision for truncated normal distributions |
| Journal Title | Microelectronics Reliability |